“Researchers find problems with RFID passport cards” (New York Times, others)

“RFID tags used in two new types of border-crossing documents in the U.S. are vulnerable to snooping and copying … United States Passport Cards issued by the U.S. Department of State and EDLs (enhanced driver’s licenses) from the state of Washington contain RFID (radio-frequency identification) tags that can be scanned at border crossings …”

Extensive media coverage of research by CSE professor Yoshi Kohno and his students includes:

New York Times
Wall Street Journal
KOMO TV
KING TV
Slashdot
RSA Laboratories

Read the research paper here (pdf).

October 25, 2008

One Response to ““Researchers find problems with RFID passport cards” (New York Times, others)”

  1. UW CSE News » RFID’s security problem Says:

    [...] provided earlier coverage on Yoshi’s research and problems with RFID passport cards. January 16, [...]